> Product engineers were, and presumably still are, responsible for writing
> test programs to run chips through their paces, in Intel's case using a
> Teradyne computer.
>
http://www.teradyne.com/products/semiconductor-test/magnum-v>
> I don't think the concept of this kind of weakness is new: Even in 1980,
> DRAMs were tested for such repeated accesses, to ensure that such errors
> would not occur. This was particularly true for a process called "device
> characterization", in which chips were attacked in all manner of
> electronically-abusive ways, to uncover these weaknesses, and fix the
> circuit design should such flaws be uncovered.
> One way these techniques could be thwarted is to return to the use of
> parity-bits (8+1 parity) in memory access, in DRAM module and computer
> design, to whatever extent they are no longer used. Any (successful)
> attempt to modify bits in a DRAM would quickly end up causing a parity
> error, which would at least show which manufacturer's DRAM chips are
> susceptible to this kind of attack. A person who was forced to use a
> no-parity computer could, at least, limit his purchases of such modules to
> those populated with DRAMs not susceptible to the problem.
> Jim Bell
to rowhammer.
you forget about the cost. Regardless of rowhammer.